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ULTRATECH INC Patents: Active

ULTRATECH INC Active Patents

13 granted patents the USPTO still lists as patented, newest filing first, as the USPTO Open Data Portal records them; the company is the first-named applicant. The application number opens the full record at Patent Center.

  • 2017-12-07: Application 15834614; Invention SCANNING METHODS FOR FOCUS CONTROL FOR LITHOGRAPHIC PROCESSING OF RECONSTITUTED WAFERS; Applicant Ultratech, Inc.; Status Patented Case.
  • 2017-10-11: Application 15729877; Invention Wafer Chuck Apparatus With Micro-Channel Regions; Applicant Ultratech, Inc.; Status Patented Case.
  • 2016-11-29: Application 15362923; Invention Systems and methods of characterizing process-induced wafer shape for process control using CGS interferometry; Applicant Ultratech, Inc.; Status Patented Case.
  • 2016-07-14: Application 15210399; Invention High-efficiency line-forming optical systems and methods using a serrated spatial filter; Applicant Ultratech, Inc.; Status Patented Case.
FiledApplicationInventionApplicantStatusGrantedPatentPublished asInventor nameInventor countryExaminer
2017-12-0715834614SCANNING METHODS FOR FOCUS CONTROL FOR LITHOGRAPHIC PROCESSING OF RECONSTITUTED WAFERSUltratech, Inc.Patented Case2019-04-2310269662US20180166348A1
Paul M. Bischoff
Emily M. True
Raymond Ellis
A.J. Crespin
United States
United States
United States
United States
SINGAL, ANKUSH K
2017-10-1115729877Wafer Chuck Apparatus With Micro-Channel RegionsUltratech, Inc.Patented Case2019-11-0510468290US20180122681A1
Raymond Ellis
A.J. Crespin
United States
United States
GATES, ERIC ANDREW
2016-11-2915362923Systems and methods of characterizing process-induced wafer shape for process control using CGS interferometryUltratech, Inc.Patented Case2018-04-039935022US20170162456A1
David M. Owen
United States
TRAN, THANH Y
2016-07-1415210399High-efficiency line-forming optical systems and methods using a serrated spatial filterUltratech, Inc.Patented Case2019-07-1610353208US20170025287A1
Serguei Anikitchev
United States
EVANS, GEOFFREY S
2016-05-1215152907POLARIZATION-BASED COHERENT GRADIENT SENSING SYSTEMS AND METHODSUltratech, Inc.Patented Case2017-10-109784570US20160363440A1
David G. Stites
United States
LEE, HWA S
2015-11-1614941712LASER ANNEALING SYSTEMS AND METHODS WITH ULTRA-SHORT DWELL TIMESUltratech, Inc.Patented Case2018-09-2510083843US20160181120A1
Andrew M. Hawryluk
Serguei Anikitchev
United States
United States
EVANS, GEOFFREY S
2015-10-3014929186HIGH-EFFICIENCY LINE-FORMING OPTICAL SYSTEMS AND METHODS FOR DEFECT ANNEALING AND DOPANT ACTIVATIONUltratech, Inc.Patented Case2017-04-049613815US20160148810A1
Andrew M. Hawryluk
Serguei Anikitchev
United States
United States
PRASAD, NEIL R
2015-06-1914744207High-efficiency line-forming optical systems and methodsUltratech, Inc.Patented Case2016-08-099411163US20160033773A1
Serguei Anikitchev
United States
SMOOT, STEPHEN W
2014-09-1814490446LASER ANNEALING SYSTEMS AND METHODS WITH ULTRA-SHORT DWELL TIMESUltratech, Inc.Patented Case2017-01-319558973US20160086832A1
Andrew M. Hawryluk
Serguei Anikitchev
United States
United States
HEINRICH, SAMUEL M
2014-07-2614341777Wynne-Dyson optical system with variable magnificationUltratech, Inc.Patented Case2016-11-089488811US20150055228A1
David G. Stites
United States
SAHLE, MAHIDERE S
2014-06-2314311747Systems and methods for reducing beam instability in laser annealingUltratech, Inc.Patented Case2017-01-319559023US20150371911A1
James T. McWhirter
Andrew Hawryluk
Serguei Anikitichev
Masoud Safa
United States
United States
United States
United States
GALVIN III, JOSEPH M
2014-05-1914281291Wynne-Dyson projection lens with reduced susceptibility to UV damageUltratech, Inc.Patented Case2016-09-069436103US20150331326A1
Peiqian Zhao
Emily M. True
Raymond Ellis
Andrew M. Hawryluk
United States
United States
United States
United States
WHITESELL, STEVEN H
2013-06-0413909542LASER ANNEALING SYSTEMS AND METHODS WITH ULTRA-SHORT DWELL TIMESUltratech, Inc.Patented Case2014-10-218865603US20130330844A1
Andrew M. Hawryluk
Serguei Anikitchev
United States
United States
HILLMAN, DAMIAN A