CASCADE MICROTECH INC Patent Applications Pending
74 applications still open at the USPTO, newest filing first, as the USPTO Open Data Portal records them; the company is the first-named applicant. The application number opens the full record at Patent Center.
- 2018-07-20: Application 62701135; Invention PROBE SYSTEMS AND METHODS FOR COLLECTING AN OPTICAL IMAGE OF A DEVICE UNDER TEST; Applicant Cascade Microtech, Inc.; Status Provisional Application Expired.
- 2018-06-05: Application 62680929; Invention PROBE STATIONS FOR TESTING A DEVICE UNDER TEST AND ASSOCIATED METHODS; Applicant Cascade Microtech, Inc.; Status Provisional Application Expired.
- 2018-01-19: Application 62619282; Invention PROBES WITH FIDUCIAL TARGETS, PROBE SYSTEMS INCLUDING THE SAME, AND ASSOCIATED METHODS; Applicant Cascade Microtech, Inc.; Status Provisional Application Expired.
- 2017-11-27: Application PCTUS2017063305; Invention CONTACT ENGINES, PROBE HEAD ASSEMBLIES, PROBE SYSTEMS, AND ASSOCIATED METHODS FOR ON-WAFER TESTING OF THE WIRELESS OPERATION OF A DEVICE UNDER TEST; Applicant CASCADE MICROTECH, INC.; Status PCT - IPER (International Preliminary Examination Report) 409-416 Mailed.
| Filed | Application | Invention | Applicant | Status | Published as | Inventor name | Inventor country | Examiner |
|---|---|---|---|---|---|---|---|---|
| 2018-07-20 | 62701135 | PROBE SYSTEMS AND METHODS FOR COLLECTING AN OPTICAL IMAGE OF A DEVICE UNDER TEST | Cascade Microtech, Inc. | Provisional Application Expired | Michael Teich Axel Becker | Germany Germany | ||
| 2018-06-05 | 62680929 | PROBE STATIONS FOR TESTING A DEVICE UNDER TEST AND ASSOCIATED METHODS | Cascade Microtech, Inc. | Provisional Application Expired | Sia Choon Beng David Randle Hess Chunyi Yin Leong | Singapore United States United States | ||
| 2018-01-19 | 62619282 | PROBES WITH FIDUCIAL TARGETS, PROBE SYSTEMS INCLUDING THE SAME, AND ASSOCIATED METHODS | Cascade Microtech, Inc. | Provisional Application Expired | Joseph George Frankel Koby L. Duckworth Kazuki Negishi | United States United States United States | ||
| 2017-11-27 | PCTUS2017063305 | CONTACT ENGINES, PROBE HEAD ASSEMBLIES, PROBE SYSTEMS, AND ASSOCIATED METHODS FOR ON-WAFER TESTING OF THE WIRELESS OPERATION OF A DEVICE UNDER TEST | CASCADE MICROTECH, INC. | PCT - IPER (International Preliminary Examination Report) 409-416 Mailed | TIM CLEARY DANIEL MARK BOCK | United States United States | GONZALEZ, MILTON | |
| 2017-10-02 | 62566641 | PROBE SYSTEMS FOR TESTING A DEVICE UNDER TEST | Cascade Microtech, Inc. | Provisional Application Expired | Christopher Storm Michael E. Simmons Bryan Conrad Bolt Gavin Neil Fisher Anthony James Lord Kazuki Negishi | United States United States United States United Kingdom United Kingdom United States | ||
| 2017-09-20 | PCTUS2017052405 | PROBE SYSTEMS AND METHODS | CASCADE MICROTECH, INC. | PCT - International Search Report Mailed to IB | GAVIN NEIL FISHER THOMAS REINER THAERIGEN KOBY L. DUCKWORTH RODNEY JONES PETER MCCANN | United Kingdom Germany United States United States United States | YOUNG, LEE W | |
| 2017-05-25 | PCTUS2017034485 | PROBE HEAD ASSEMBLIES AND PROBE SYSTEMS FOR TESTING INTEGRATED CIRCUIT DEVICES | CASCADE MICROTECH, INC. | PCT - IPER (International Preliminary Examination Report) 409-416 Mailed | JAY SALMON ROY E. SWART BRANDON LIEW | United States United States United States | PATEL, PARESH H | |
| 2017-05-24 | PCTUS2017034210 | SYSTEMS AND METHODS FOR ELECTRICALLY TESTING ELECTROMIGRATION IN AN ELECTROMIGRATION TEST STRUCTURE | CASCADE MICROTECH, INC. | PCT - IPER (International Preliminary Examination Report) 409-416 Mailed | TIMOTHY ALLEN MCMULLEN ERIC JAMES WILCOX JAMES J. DONLIN BRENT DALE HARRY | United States United States United States United States | PATEL, PARESH H | |
| 2017-05-23 | 62510127 | PROBE STATIONS, PROBE SYSTEMS INCLUDING THE PROBE STATIONS, AND METHODS FOR CONTROLLING THE OPERATION OF PROBE STATIONS | Cascade Microtech, Inc. | Provisional Application Expired | Jens Fiedler Ralf Keller Jeremy Houston Smith | Germany Germany United States | ||
| 2017-05-09 | PCTUS2017031730 | SPACE TRANSFORMERS, PLANARIZATION LAYERS FOR SPACE TRANSFORMERS, METHODS OF FABRICATING SPACE TRANSFORMERS, AND METHODS OF PLANARIZING SPACE TRANSFORMERS | CASCADE MICROTECH, INC. | PCT - IPER (International Preliminary Examination Report) 409-416 Mailed | BRANDON LIEW ROY E. SWART JAY SALMON | United States United States United States | CHAN, TSZFUNG JACKIE | |
| 2017-04-04 | 62481245 | PROBE SYSTEMS AND METHODS INCLUDING ELECTRIC CONTACT DETECTION | Cascade Microtech, Inc. | Provisional Application Expired | Sia Choon Beng Kazuki Negishi | Singapore United States | ||
| 2017-03-29 | PCTUS2017024748 | PROBE SYSTEMS, STORAGE MEDIA, AND METHODS FOR WAFER-LEVEL TESTING OVER EXTENDED TEMPERATURE RANGES | CASCADE MICROTECH, INC. | PCT - International Search Report Mailed to IB | TIMOTHY ALLEN MCMULLEN CLINT VANDER GIESSEN JEFFERY ALLAN SHEPLER | United States United States United States | THOMAS, SHANE M | |
| 2017-03-28 | PCTUS2017024580 | SHIELDED PROBE SYSTEMS WITH CONTROLLED TESTING ENVIRONMENTS | CASCADE MICROTECH, INC. | PCT - International Search Report Mailed to IB | MICHAEL TEICH KARSTEN STOLL SWEN SCHMIEDCHEN WALTER MATTHIAS CLAUSS | Germany Germany Germany Germany | THOMAS, SHANE M | |
| 2016-12-22 | PCTUS2016068270 | PROBE SYSTEMS AND METHODS INCLUDING ACTIVE ENVIRONMENTAL CONTROL | CASCADE MICROTECH, INC. | PCT - IPE Opinion (408) Mailed | UlF HACKIUS FRANK ZILL JORG KIESEWETTER MIRKO KREHER MICHAEL TEICH | Germany Germany Germany Germany Germany | FAN, SU JYA | |
| 2016-12-21 | PCTUS2016068121 | SHIELDED PROBE SYSTEMS | CASCADE MICROTECH, INC. | PCT - IPER (International Preliminary Examination Report) 409-416 Mailed | BRYAN CONRAD BOLT JOSEPH GEORGE FRANKEL CHRISTOPHER ANTHONY STORM MICHAEL E. SIMMONS ROBBIE INGRAM-GOBLE KAZUKI NEGISHI | United States United States United States United States United States United States | HAWKINS, DOMINIC E | |
| 2016-12-21 | PCTUS2016068114 | PROBES WITH FIDUCIAL MARKS, PROBE SYSTEMS INCLUDING THE SAME, AND ASSOCIATED METHODS | CASCADE MICROTECH, INC. | RO PROCESSING COMPLETED-PLACED IN STORAGE | BRYAN CONRAD BOLT JOSEPH GEORGE FRANKEL | United States United States | YOUNG, LEE W | |
| 2016-11-30 | 62428297 | CONTACT ENGINES, PROBE HEAD ASSEMBLIES, AND PROBE SYSTEMS FOR ON-WAFER TESTING OF THE WIRELESS OPERATION OF A DEVICE UNDER TEST | Cascade Microtech, Inc. | Provisional Application Expired | Daniel Mark Bock Tim Cleary | United States United States | ||
| 2016-09-28 | 62400978 | PROBE SYSTEMS AND METHODS | Cascade Microtech, Inc. | Provisional Application Expired | Gavin Neil Fisher Thomas Reiner Thaerigen Peter McCann Rodney Jones Koby L. Duckworth | United Kingdom Germany United States United States United States | ||
| 2016-04-01 | 62317168 | METHODS FOR WAFER-LEVEL TESTING OVER EXTENDED TEMPERATURE RANGES | Cascade Microtech, Inc. | Provisional Application Expired | Clint Richard Vander Giessen | United States | ||
| 2015-11-25 | 62259814 | PROBE SYSTEMS AND METHODS FOR AUTOMATICALLY MAINTAINING ALIGNMENT BETWEEN A PROBE AND A DEVICE UNDER TEST DURING A TEMPERATURE CHANGE | Cascade Microtech, Inc. | Provisional Application Expired | Peter Douglas Andrews David Michael Newton David Randle Hess | United States United States United States | ||
| 2015-02-26 | PCTUS2015017678 | WAFER-HANDLING END EFFECTORS | CASCADE MICROTECH, INC. | PCT - IPER (International Preliminary Examination Report) 409-416 Mailed | CHRISTOPHER STORM ROBBIE INGRAM-GOBLE MICHAEL E. SIMMONS RYAN GARRISON PHILIP WOLF | United States United States United States United States United States | LOWE, MICHAEL S | |
| 2015-02-20 | PCTUS2015016926 | SYSTEMS AND METHODS FOR ON-WAFER DYNAMIC TESTING OF ELECTRONIC DEVICES | CASCADE MICROTECH, INC. | RO PROCESSING COMPLETED-PLACED IN STORAGE | ERIC HILL KAZUKI NEGISHI | United States United States | THOMAS, SHANE M | |
| 2014-03-06 | 61949096 | WAFER-HANDLING END EFFECTORS | CASCADE MICROTECH, INC. | Provisional Application Expired | Robbie Ingram-Goble Michael E. Simmons Philip Wolf Ryan Garrison Christopher Storm | United States United States United States United States United States | ||
| 2014-02-25 | 61944461 | SYSTEMS AND METHODS FOR ON-WAFER DYNAMIC TESTING OF ELECTRONIC DEVICES | CASCADE MICROTECH, INC. | Provisional Application Expired | Kazuki Negishi Eric Hill | United States United States | ||
| 2013-12-30 | PCTUS2013078222 | SYSTEMS AND METHODS FOR PROVIDING WAFER ACCESS IN A WAFER PROCESSING SYSTEM | CASCADE MICROTECH, INC, | RO PROCESSING COMPLETED-PLACED IN STORAGE | FRNAK FEHRMANN STOJAN KANEV BOTHO HIRSCHFELD | Germany Germany Germany | THOMAS, SHANE M | |
| 2013-12-30 | PCTUS2013078218 | SYSTEMS AND METHODS FOR HANDLING SUBSTRATES AT BELOW DEW POINT TEMPERATURES | CASCADE MICROTECH, INC. | RO PROCESSING COMPLETED-PLACED IN STORAGE | AXEL BECKER BOTHO HIRSCHFELD | Germany Germany | THOMAS, SHANE M | |
| 2013-12-30 | PCTUS2013078214 | SYSTEMS AND METHODS FOR ROTATIONAL ALIGNMENT OF A DEVICE UNDER TEST | CASCADE MICROTECH, INC. | RO PROCESSING COMPLETED-PLACED IN STORAGE | KARSTEN STOLL JORG KIESEWETTER | Germany Germany | THOMAS, SHANE M | |
| 2013-11-05 | PCTUS2013068518 | SYSTEMS AND METHODS FOR TESTING ELECTRONIC DEVICES THAT INCLUDE LOW POWER OUTPUT DRIVERS | CASCADE MICROTECH, INC. | RO PROCESSING COMPLETED-PLACED IN STORAGE | KENNETH R. SMITH DANIEL M. BOCK | United States United States | YOUNG, LEE W | |
| 2013-09-11 | 61876680 | SYSTEMS AND METHODS FOR TESTING ELECTRONIC DEVICES THAT INCLUDE LOW POWER OUTPUT DRIVERS | Cascade Microtech, Inc. | Provisional Application Expired | Daniel M. Bock Kenneth R. Smith | United States United States | ||
| 2012-12-31 | 61747703 | SYSTEMS AND METHODS FOR PROVIDING WAFER ACCESS IN A WAFER PROCESSING SYSTEM | CASCADE MICROTECH, INC. | Provisional Application Expired | Frank Fehrmann | Germany | ||
| 2012-12-31 | 61747686 | SYSTEMS AND METHODS FOR HANDLING WAFERS AT BELOW DEW POINT TEMPERATURES | CASCADE MICROTECH, INC. | Provisional Application Expired | Botho Hirschfeld Axel Becker | Germany Germany | ||
| 2012-12-31 | 61747628 | SYSTEMS AND METHODS FOR ROTATIONAL ALIGNMENT OF A DEVICE UNDER TEST | CASCADE MICROTECH, INC. | Provisional Application Expired | Jörg Kiesewetter Karsten Stoll | Germany Germany | ||
| 2012-11-07 | 61723401 | SYSTEMS AND METHODS FOR TESTING ELECTRONIC DEVICES THAT INCLUDE LOW POWER OUTPUT DRIVERS | Cascade Microtech, Inc. | Provisional Application Expired | Daniel M. Bock Kenneth R. Smith | United States United States | ||
| 2012-09-12 | PCTUS2012054736 | RISERS INCLUDING A PLURALITY OF HIGH ASPECT RATIO ELECTRICAL CONDUITS AND SYSTEMS AND METHODS OF MANUFACTURE AND USE THEREOF | CASCADE MICROTECH, INC. | RO PROCESSING COMPLETED-PLACED IN STORAGE | KOBY L. DUCKWORTH ERIC HILL JODY CURTIS KURT SCHULTZ MIKE JOLLEY | United States United States United States United States United States | THOMAS, SHANE M | |
| 2012-07-06 | PCTUS2012045733 | SYSTEMS, DEVICES, AND METHODS FOR TWO-SIDED TESTING OF ELECTRONIC DEVICES | CASCADE MICROTECH, INC. | RO PROCESSING COMPLETED-PLACED IN STORAGE | TIM CLEARY DAVID LESLIE K. REED GLEASON KEN SMITH ERIC HILL ERIC STRID PETER HANAWAY | United States United States United States United States United States United States United States | YOUNG, LEE W | |
| 2012-06-01 | PCTUS2012040366 | HIGH FREQUENCY INTERCONNECT STRUCTURES, ELECTRONIC ASSEMBLIES THAT UTILIZE HIGH FREQUENCY INTERCONNECT STRUCTURES, AND METHODS OF OPERATING THE SAME | CASCADE MICROTECH, INC. | RO PROCESSING COMPLETED-PLACED IN STORAGE | ERIC W. STRID RICHARD L. CAMPBELL KOOHO JUNG K. REED GLEASON KENNETH R. SMITH | United States United States United States United States United States | YOUNG, LEE W | |
| 2011-11-03 | PCTUS2011059091 | RESILIENT ELECTRICAL INTERPOSERS, SYSTEMS THAT INCLUDE THE INTERPOSERS, AND METHODS FOR USING AND FORMING THE SAME | CASCADE MICROTECH, INC. | PCT - IPER (International Preliminary Examination Report) 409-416 Mailed | ERIC STRID K. REED GLEASON KOBY L. DUCKWORTH MIKE JOLLEY PETER HANAWAY KENNETH R. SMITH | United States United States United States United States United States United States | BENITEZ ROSARIO, JOSHUA | |
| 2011-10-18 | PCTUS2011056626 | SYSTEMS AND METHODS FOR SIMULTANEOUS OPTICAL TESTING OF A PLURALITY OF DEVICES UNDER TEST | CASCADE MICROTECH, INC. | PCT - IPER (International Preliminary Examination Report) 409-416 Mailed | KAZUKI NEGISHI BRYAN BOLT ERIC W. STRID STEVE HARRIS | United States United States United States United States | BENITEZ ROSARIO, JOSHUA | |
| 2011-09-16 | PCTUS2011051899 | SYSTEMS AND METHODS FOR NON-CONTACT POWER AND DATA TRANSFER IN ELECTRONIC DEVICES | CASCADE MICROTECH, INC. | RO PROCESSING COMPLETED-PLACED IN STORAGE | ERIC W. STRID | United States | THOMAS, SHANE M | |
| 2011-04-11 | PCTUS2011031981 | HIGH VOLTAGE CHUCK FOR A PROBE STATION | CASCADE MICROTECH, INC. | PCT - IPER (International Preliminary Examination Report) 409-416 Mailed | RYAN GARRISON ROY JENSEN PHILIP WOLF MICHAEL E. SIMMONS KAZUKI NEGISHI | United States United States United States United States United States | WILSON, LEE D | |
| 2011-04-11 | PCTUS2011031964 | HIGH VOLTAHE CHUCK FOR A PROBE STATION | CASCADE MICROTECH, INC. | RO PROCESSING COMPLETED-PLACED IN STORAGE | KAZUKI NEGISHI MICHAEL E. SIMMONS PHILIP WOLF ROY JENSEN RYAN GARRISON | United States United States United States United States United States | THOMAS, SHANE M | |
| 2011-03-14 | PCTUS2011028373 | SYSTEM FOR TESTING SEMICONDUCTORS | CASCADE MICROTECH, INC. | PCT - IPER (International Preliminary Examination Report) 409-416 Mailed | DAVID HESS PETER ANDREWS | United States United States | VAZQUEZ, ARLEEN M | |
| 2011-02-18 | PCTUS2011025476 | PROBE STATION WITH IMPROVED INTERCONNECTION | CASCADE MICROTECH, INC. | PCT - IPER (International Preliminary Examination Report) 409-416 Mailed | MICHAEL SIMMONS KAZUKI NEGISHI CHRISTOPHER STORM TOENAING SWE | United States United States United States United States | VELEZ, ROBERTO | |
| 2009-12-29 | PCTUS2009069647 | LOW INSERTION FORCE BGA SOCKET ASSEMBLY | CASCADE MICROTECH, INC. | RO PROCESSING COMPLETED-PLACED IN STORAGE | GREGORY D. SPANIER MARTIN CAVEGN | United States United States | ||
| 2009-11-20 | PCTUS2009006250 | REPLACEABLE COUPON FOR A PROBING APPARATUS | CASCADE MICROTECH, INC. | PCT - IPER (International Preliminary Examination Report) 409-416 Mailed | KENNETH R. SMITH | United States | BRIDGERS, JOYCE ANN | |
| 2009-10-06 | PCTUS2009005491 | IMPEDANCE OPTIMIZED INTERFACE FOR MEMBRANE PROBE APPLICATION | CASCADE MICROTECH, INC. | PCT - IPER (International Preliminary Examination Report) 409-416 Mailed | ROGER HAYWARD KENNETH R. SMITH | United States United States | BRIDGERS, JOYCE ANN | |
| 2009-06-12 | PCTUS2009003574 | CALIBRATION TECHNIQUE | CASCADE MICROTECH, INC. | PCT - IPER (International Preliminary Examination Report) 409-416 Mailed | ERIC W. STRID ROGER HAYWARD KENNETH R. SMITH | United States United States United States | LAWRENCE, DORETHEA | |
| 2007-07-17 | PCTUS2007016220 | LINE-REFLECT MATCH CALIBRATION | CASCADE MICROTECH, INC. | PCT - IPER (International Preliminary Examination Report) 409-416 Mailed | LEONARD HAYDEN | United States | HUYNH, PHUONG | |
| 2007-07-13 | PCTUS2007016055 | UNILATERALIZED AMPLIFIER | CASCADE MICROTECH, INC. | PCT - IPER (International Preliminary Examination Report) 409-416 Mailed | RICHARD L. CAMPBELL | United States | ROBINSON, ANDRE | |
| 2007-06-11 | PCTUS2007013778 | DIFFERENTIAL SIGNAL PROBE WITH INTEGRAL BALUN | CASCADE MICROTECH, INC. | RO PROCESSING COMPLETED-PLACED IN STORAGE | RICHARD CAMPBELL MIKE ANDREWS ERIC W. STRID | United States United States United States | VAZQUEZ, ARLEEN M | |
| 2007-05-03 | PCTUS2007010803 | CALIBRATION STRUCTURES FOR DIFFERENTIAL SIGNAL PROBING | CASCADE MICROTECH, INC. | PCT - IPER (International Preliminary Examination Report) 409-416 Mailed | RICHARD CAMPBELL ERIC STRID | United States United States | PROCTOR, JEAN | |
| 2007-05-03 | PCTUS2007010802 | ON-WAFER TEST STRUCTURES | CASCADE MICROTECH, INC. | PCT - IPER (International Preliminary Examination Report) 409-416 Mailed | ERIC STRID RICHARD CAMPBELL | United States United States | PROCTOR, JEAN | |
| 2007-05-03 | PCTUS2007010801 | A TEST STRUCTURE AND PROBE FOR DIFFERENTIAL SIGNALS | CASCADE MICROTECH, INC. | PCT - IPER (International Preliminary Examination Report) 409-416 Mailed | RICHARD CAMPBELL | United States | FORD, JANICE M | |
| 2007-05-03 | PCTUS2007010800 | DIFFERENTIAL SIGNAL PROBING SYSTEM | CASCADE MICROTECH, INC. | PCT - IPER (International Preliminary Examination Report) 409-416 Mailed | ERIC STRID RICHARD CAMPBELL | United States United States | FORD, JANICE M | |
| 2006-06-26 | PCTUS2006024780 | A FLUID DISPENSING SYSTEM | CASCADE MICROTECH, INC. | PCT - IPER (International Preliminary Examination Report) 409-416 Mailed | K. REED GLEASON PETER NAVRATIL JOHN DUNKLEE THANE ALLISON JOHN MARTIN CALI SARTOR | United States United States United States United States United States United States | HANDY, DWAYNE K | |
| 2006-04-28 | PCTUS2006016238 | WIDEBAND ACTIVE-PASSIVE DIFFERENTIAL SIGNAL PROBE | CASCADE MICROTECH, INC. | PCT - IPER (International Preliminary Examination Report) 409-416 Mailed | RICHARD CAMPBELL | United States | DSOUZA, JOSEPH FRANCIS A | |
| 2006-01-19 | PCTUS2006002109 | MICROSCOPE SYSTEM FOR TESTING SEMICONDUCTORS | CASCADE MICROTECH, INC. | PCT - IPER (International Preliminary Examination Report) 409-416 Mailed | PETER ANDREWS ROBERT NEW DAVID HESS | Unknown States, Other Entities Or Organizations United States United States | PERKEY, WILLIAM B | |
| 2005-09-08 | PCTUS2005032159 | DOUBLE SIDED PROBING STRUCTURES | CASCADE MICROTECH, INC. | PCT - IPER (International Preliminary Examination Report) 409-416 Mailed | TERRY BURCHAM ROD JONES PETER MCCANN | United States United States United States | PRESTON, RENEE M | |
| 2005-07-05 | PCTUS2005023806 | PROBE HEAD HAVING A MEMBRANE SUSPENDED PROBE | CASCADE MICROTECH, INC. | PCT - IPER (International Preliminary Examination Report) 409-416 Mailed | KENNETH SMITH VICTORIA VAN SYCKEL MICHAEL JOLLEY | United States United States United States | HOLLINGTON, JERMELE M | |
| 2005-06-14 | PCTUS2005020962 | LOCALIZING A TEMPERATURE OF A DEVICE FOR TESTING | CASCADE MICROTECH, INC. | PCT - IPER (International Preliminary Examination Report) 409-416 Mailed | BRUCE MCFADDEN | United States | TANG, MINH NHUT | |
| 2005-05-06 | PCTUS2005015977 | THERMAL OPTICAL CHUCK | CASCADE MICROTECH, INC. | PCT - IPER (International Preliminary Examination Report) 409-416 Mailed | SCOTT RUMBAUGH | United States | NGUYEN, TUNG X | |
| 2004-12-21 | PCTUS2004043231 | ACTIVE WAFER PROBE | CASCADE MICROTECH, INC. | PCT - IPER (International Preliminary Examination Report) 409-416 Mailed | K. REED GLEASON ERIC STRID | United States United States | TANG, MINH NHUT | |
| 2004-09-15 | PCTUS2004030545 | PROBE TESTING STRUCTURE | CASCADE MICROTECH, INC. | PCT - IPER (International Preliminary Examination Report) 409-416 Mailed | TIMOTHY E. LESHER | United States | HU, SHOUXIANG | |
| 2004-09-14 | PCTUS2004030276 | CHUCK WITH INTEGRATED WAFER SUPPORT | CASCADE MICROTECH, INC. | PCT - IPER (International Preliminary Examination Report) 409-416 Mailed | PETER ANDREWS JOHN DUNKLEE BRAD FROEMKE | United States United States United States | HOLLINGTON, JERMELE M | |
| 2004-04-26 | PCTUS2004012806 | PROBE FOR TESTING A DEVICE UNDER TEST | CASCADE MICROTECH, INC. | PCT - IPER (International Preliminary Examination Report) 409-416 Mailed | K. REED GLEASON JOHN MARTIN MIKE ANDREWS TIM LESHER | United States United States United States United States | NGUYEN, VINH P | |
| 2004-04-22 | PCTUS2004012248 | CHUCK FOR HOLDING A DEVICE UNDER TEST | CASCADE MICROTECH, INC. | PCT - IPER (International Preliminary Examination Report) 409-416 Mailed | RODD JONES JEFF SPENCER TERRY BURCHAM PETER MCMANN ANTHONY LORD TIM LESHER DAVID NEWTON CRAIG STEWRT JOHN DUNKLEE | United States United States United States United States United Kingdom United States United States United Kingdom United States | CHAN, EMILY Y | |
| 2004-04-21 | PCTUS2004012338 | SWITCHED SUSPENDED CONDUCTOR AND CONNECTION | CASCADE MICROTECH, INC. | PCT - IPER (International Preliminary Examination Report) 409-416 Mailed | JOHN DUNKLEE | United States | CHAN, EMILY Y | |
| 2003-10-28 | PCTUS2003034261 | APROBE FOR COMBINED SIGNALS | CASCADE MICROTECH, INC. | PCT - IPER (International Preliminary Examination Report) 409-416 Mailed | LEONARD HAYDEN MIKE ANDREWS SCOTT RUMBAUGH | United States United States United States | NGUYEN, TRUNG Q | |
| 2003-10-27 | PCTUS2003034122 | GUARDED TUB ENCLOSURE | CASCADE MICROTECH, INC. | PCT - IPER (International Preliminary Examination Report) 409-416 Mailed | JOHN DUNKLEE CLARENCE E. COWAN GREG NORGDEN | United States United States United States | NGUYEN, TUNG X | |
| 2003-10-24 | PCTUS2003033842 | PROBE STATION WITH LOW NOISE CHARACTERISTICS | CASCADE MICROTECH, INC. | PCT - IPER (International Preliminary Examination Report) 409-416 Mailed | TIMOTHY LESHER BRAD MILLER CYNTHIA L. MCDONALD MICHAEL SIMMONS FRANK GRAY CLARENCE E. COWAN | United States United States United States United States United States United States | NGUYEN, VINH P | |
| 2003-10-24 | PCTUS2003033767 | PROBE STATION WITH LOW INDUCTANCE PATH | CASCADE MICROTECH, INC. | PCT - IPER (International Preliminary Examination Report) 409-416 Mailed | CLARENCE E. COWAN JOHN DUNKLEE | United States United States | HOPPE, SHARON S | |
| 2002-12-04 | PCTUS2002038960 | PROBE STATION | CASCADE MICROTECH, INC. | PCT - IPER (International Preliminary Examination Report) 409-416 Mailed | BRAD FROEMKE JEFF SPENCER SCOTT RUMBAUGH PETE MC CANN GAVIN FISHER PETER NAVRATIL CRAIG STEWART ANTHONY LORD ROD JONES | Unknown States, Other Entities Or Organizations Unknown States, Other Entities Or Organizations Unknown States, Other Entities Or Organizations Unknown States, Other Entities Or Organizations United Kingdom Unknown States, Other Entities Or Organizations United Kingdom United Kingdom Unknown States, Other Entities Or Organizations | NGUYEN, JIMMY | |
| 2002-08-19 | PCTUS2002026475 | MEMBRANE PROBING SYSTEM | CASCADE MICROTECH, INC. | PCT - IPER (International Preliminary Examination Report) 409-416 Mailed | REED GLEASON KENNTH SMITH | United States United States | PATEL, PARESH H | |
| 2002-08-07 | PCTUS2002025255 | OPTICAL TESTING DEVICE | CASCADE MICROTECH, INC. | PCT - IPER (International Preliminary Examination Report) 409-416 Mailed | PETER R. MC CANN DANIEL L. HARRIS | United States United States | NGUYEN, TUNG X |