CASCADE MICROTECH INC Active Patents
20 granted patents the USPTO still lists as patented, newest filing first, as the USPTO Open Data Portal records them; the company is the first-named applicant. The application number opens the full record at Patent Center.
- 2018-03-23: Application 15934672; Invention PROBE SYSTEMS AND METHODS INCLUDING ELECTRIC CONTACT DETECTION; Applicant Cascade Microtech, Inc.; Status Patented Case.
- 2017-11-22: Application 15821101; Invention CONTACT ENGINES, PROBE HEAD ASSEMBLIES, PROBE SYSTEMS, AND ASSOCIATED METHODS FOR ON-WAFER TESTING OF THE WIRELESS OPERATION OF A DEVICE UNDER TEST; Applicant Cascade Microtech, Inc.; Status Patented Case.
- 2017-10-05: Application 15725650; Invention SHIELDED PROBE SYSTEMS WITH CONTROLLED TESTING ENVIRONMENTS; Applicant Cascade Microtech, Inc.; Status Patented Case.
- 2017-09-19: Application 15708681; Invention PROBE SYSTEMS AND METHODS; Applicant Cascade Microtech, Inc.; Status Patented Case.
| Filed | Application | Invention | Applicant | Status | Granted | Patent | Published as | Inventor name | Inventor country | Examiner |
|---|---|---|---|---|---|---|---|---|---|---|
| 2018-03-23 | 15934672 | PROBE SYSTEMS AND METHODS INCLUDING ELECTRIC CONTACT DETECTION | Cascade Microtech, Inc. | Patented Case | 2019-06-25 | 10330703 | US20180284155A1 | Sia Choon Beng Kazuki Negishi | Singapore United States | HE, AMY |
| 2017-11-22 | 15821101 | CONTACT ENGINES, PROBE HEAD ASSEMBLIES, PROBE SYSTEMS, AND ASSOCIATED METHODS FOR ON-WAFER TESTING OF THE WIRELESS OPERATION OF A DEVICE UNDER TEST | Cascade Microtech, Inc. | Patented Case | 2020-02-25 | 10571487 | US20180149674A1 | Daniel Mark Bock Tim Cleary | United States United States | GONZALEZ, MILTON |
| 2017-10-05 | 15725650 | SHIELDED PROBE SYSTEMS WITH CONTROLLED TESTING ENVIRONMENTS | Cascade Microtech, Inc. | Patented Case | 2019-05-07 | 10281492 | US20180031608A1 | Michael Teich Karsten Stoll Walter Matthias Clauss Swen Schmiedchen | Germany Germany Germany Germany | RIOS RUSSO, RAUL J |
| 2017-09-19 | 15708681 | PROBE SYSTEMS AND METHODS | Cascade Microtech, Inc. | Patented Case | 2019-10-29 | 10459006 | US20180088149A1 | Gavin Neil Fisher Thomas Reiner Thaerigen Peter McCann Rodney Jones Koby L. Duckworth | United Kingdom Germany United States United States United States | NGUYEN, VINCENT Q |
| 2017-08-07 | 15670364 | HIGH VOLTAGE CHUCK FOR A PROBE STATION | Cascade Microtech, Inc. | Patented Case | 2018-08-28 | 10062597 | US20170338142A1 | Michael E. Simmons Kazuki Negishi Ryan Garrison Philip Wolf | United States United States United States United States | GATES, ERIC ANDREW |
| 2017-03-28 | 15471199 | PROBE SYSTEMS, STORAGE MEDIA, AND METHODS FOR WAFER-LEVEL TESTING OVER EXTENDED TEMPERATURE RANGES | Cascade Microtech, Inc. | Patented Case | 2018-08-28 | 10060963 | US20170285083A1 | Timothy Allen McMullen Jeffery Allan Shepler Clint Vander Giessen | United States United States United States | NGUYEN, TUNG X |
| 2016-10-31 | 15339419 | PROBE SYSTEMS AND METHODS FOR AUTOMATICALLY MAINTAINING ALIGNMENT BETWEEN A PROBE AND A DEVICE UNDER TEST DURING A TEMPERATURE CHANGE | Cascade Microtech, Inc. | Patented Case | 2019-07-30 | 10365323 | US20170146594A1 | Peter Douglas Andrews David Michael Newton David Randle Hess | United States United States United States | NGUYEN, VINH P |
| 2016-07-28 | 15222113 | METHOD OF ELECTRICALLY CONTACTING A BOND PAD OF A DEVICE UNDER TEST WITH A PROBE | Cascade Microtech, Inc. | Patented Case | 2019-04-23 | 10267848 | US20160334465A1 | Kenneth R. Smith | United States | PHAN, THIEM D |
| 2016-06-16 | 15184374 | PROBE HEAD ASSEMBLIES AND PROBE SYSTEMS FOR TESTING INTEGRATED CIRCUIT DEVICES | CASCADE MICROTECH, INC. | Patented Case | 2018-11-06 | 10120020 | US20170363681A1 | JAY SALMON ROY E. SWART BRANDON LIEW | United States United States United States | PATEL, PARESH H |
| 2016-04-08 | 15094716 | SHIELDED PROBE SYSTEMS WITH CONTROLLED TESTING ENVIRONMENTS | Cascade Microtech, Inc. | Patented Case | 2017-10-10 | 9784763 | US20170292974A1 | Michael Teich Karsten Stoll Walter Matthias Clauss Swen Schmiedchen | Germany Germany Germany Germany | RIOS RUSSO, RAUL J |
| 2016-03-16 | 15072204 | TEST STANDARDS AND METHODS FOR IMPEDANCE CALIBRATION OF A PROBE SYSTEM, AND PROBE SYSTEMS THAT INCLUDE THE TEST STANDARDS OR UTILIZE THE METHODS | Cascade Microtech, Inc. | Patented Case | 2019-01-15 | 10180486 | US20170269183A1 | Daniel M. Bock Samantha Nhim Lynh Thuy Bui | United States United States United States | ALEJNIKOV JR, ROBERT P |
| 2016-03-16 | 15072170 | HIGH VOLTAGE CHUCK FOR A PROBE STATION | Cascade Microtech, Inc. | Patented Case | 2017-08-22 | 9741599 | US20160195579A1 | Michael E. Simmons Kazuki Negishi Ryan Garrison Philip Wolf | United States United States United States United States | GATES, ERIC ANDREW |
| 2016-01-15 | 14997371 | PROBES WITH FIDUCIAL MARKS, PROBE SYSTEMS INCLUDING THE SAME, AND ASSOCIATED METHODS | Cascade Microtech, Inc. | Patented Case | 2017-10-31 | 9804196 | US20170205443A1 | Bryan Conrad Bolt Joseph George Frankel | United States United States | FERDOUS, ZANNATUL |
| 2016-01-15 | 14997345 | SHIELDED PROBE SYSTEMS | Cascade Microtech, Inc. | Patented Case | 2018-08-28 | 10060950 | US20170205446A1 | Michael E. Simmons Bryan Conrad Bolt Christopher Anthony Storm Kazuki Negishi Joseph George Frankel Robbie Ingram-Goble | United States United States United States United States United States United States | HAWKINS, DOMINIC E |
| 2015-02-18 | 14625385 | SYSTEMS AND METHODS FOR ON-WAFER DYNAMIC TESTING OF ELECTRONIC DEVICES | Cascade Microtech, Inc. | Patented Case | 2019-05-07 | 10281518 | US20150241472A1 | Kazuki Negishi Eric Hill | United States United States | MCANDREW, CHRISTOPHER P |
| 2014-09-19 | 14491606 | PROBER FOR TESTING DEVICES IN A REPEAT STRUCTURE ON A SUBSTRATE | Cascade Microtech, Inc. | Patented Case | 2018-05-29 | 9983232 | US20150008948A1 | Frank-Michael Werner Matthias Zieger Sebastian Giessmann | Germany Germany Germany | NGUYEN, TRUNG Q |
| 2013-12-27 | 14141812 | SYSTEMS AND METHODS FOR PROVIDING WAFER ACCESS IN A WAFER PROCESSING SYSTEM | Cascade Microtech, Inc. | Patented Case | 2016-06-21 | 9373533 | US20140186145A1 | Frank Fehrmann Botho Hirschfeld Stojan Kanev | Germany Germany Germany | TANG, MINH NHUT |
| 2013-12-27 | 14141781 | SYSTEMS AND METHODS FOR HANDLING SUBSTRATES AT BELOW DEW POINT TEMPERATURES | Cascade Microtech, Inc. | Patented Case | 2016-06-28 | 9377423 | US20140185649A1 | Botho Hirschfeld Axel Becker | Germany Germany | TRAN, TRAN M. |
| 2013-11-04 | 14071388 | SYSTEMS AND METHODS FOR TESTING ELECTRONIC DEVICES THAT INCLUDE LOW POWER OUTPUT DRIVERS | CASCADE MICROTECH, INC. | Patented Case | 2016-10-18 | 9470753 | US20140125363A1 | Daniel M. Bock Kenneth R. Smith | United States United States | NGUYEN, VINH P |
| 2013-04-01 | 13854725 | METHOD OF REPLACING AN EXISTING CONTACT OF A WAFER PROBING ASSEMBLY | CASCADE MICROTECH, INC. | Patented Case | 2016-08-30 | 9429638 | US20130220513A1 | Kenneth R. Smith | United States | PHAN, THIEM D |