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SUNEDISON, INC. Patents: Applications Pending, 2013

SUNEDISON, INC. Patent Applications Pending

23 applications still open at the USPTO, newest filing first, as the USPTO Open Data Portal records them; the company is the first-named applicant. The application number opens the full record at Patent Center.

  • 2013-12-27: Application PCTUS2013078062; Invention IMPROVING OPERATION OF FLUIDIZED BED REACTORS BY OPTIMIZING TEMPERATURE GRADIENTS VIA PARTICLE SIZE DISTRIBUTION CONTROL; Applicant SUNEDISON, INC.; Status RO PROCESSING COMPLETED-PLACED IN STORAGE.
  • 2013-12-19: Application PCTUS2013076708; Invention METHODS TO BOND SILICA PARTS; Applicant SUNEDISON, INC.; Status RO PROCESSING COMPLETED-PLACED IN STORAGE.
  • 2013-12-17: Application PCTUS2013075580; Invention WEIR FOR INHIBITING MELT FLOW IN A CRUCIBLE; Applicant SUNEDISON, INC.; Status RO PROCESSING COMPLETED-PLACED IN STORAGE.
  • 2013-12-09: Application PCTUS2013073865; Invention CRYSTALLINE PHOTOVOLTAIC CELLS AND METHODS OF MANUFACTURING; Applicant SUNEDISON, INC.; Status RO PROCESSING COMPLETED-PLACED IN STORAGE.
FiledApplicationInventionApplicantStatusPublished asInventor nameInventor countryExaminer
2013-12-27PCTUS2013078062IMPROVING OPERATION OF FLUIDIZED BED REACTORS BY OPTIMIZING TEMPERATURE GRADIENTS VIA PARTICLE SIZE DISTRIBUTION CONTROLSUNEDISON, INC.RO PROCESSING COMPLETED-PLACED IN STORAGE
BAISHENG ZOU
JIA WEI CHEW
United States
United States
2013-12-19PCTUS2013076708METHODS TO BOND SILICA PARTSSUNEDISON, INC.RO PROCESSING COMPLETED-PLACED IN STORAGE
SHAILENDRA B. RATHOD
RICHARD J. PHILLIPS
United States
United States
2013-12-17PCTUS2013075580WEIR FOR INHIBITING MELT FLOW IN A CRUCIBLESUNEDISON, INC.RO PROCESSING COMPLETED-PLACED IN STORAGE
TIRUMANI N. SWAMINATHAN
United States
2013-12-09PCTUS2013073865CRYSTALLINE PHOTOVOLTAIC CELLS AND METHODS OF MANUFACTURINGSUNEDISON, INC.RO PROCESSING COMPLETED-PLACED IN STORAGE
HONGBIN FANG
BANG NGUYEN
HSIU-WU GUO
BO LI
United States
United States
United States
United States
2013-11-0161898983METHOD OF MANUFACTURING HIGH RESISTIVITY SOI WAFERS WITH CHARGE TRAPPING LAYERS BASED ON TERMINATED SI DEPOSITIONSunEdison, Inc.Provisional Application Expired
Igor Peidous
Illaria Katia Marianna Pellicano
United States
Italy
2013-10-3161898065METHOD OF MANUFACTURING HIGH RESISTIVITY SOI WAFERS WITH CHARGE TRAPPING LAYERS BASED ON TERMINATED SI DEPOSITIONSunEdison, Inc.Provisional Application Expired
Igor Peidous
Illaria Katia Marianna Pellicano
United States
Italy
2013-10-18PCTUS2013065624USING WAVELET DECOMPOSITION TO DETERMINE THE FLUIDIZATION QUALITY IN A FLUIDIZED BED REACTORSUNEDISON, INC.RO PROCESSING COMPLETED-PLACED IN STORAGE
JIA WEI CHEW
KEITH WEATHERFORD
SATISH BHUSARAPU
United States
United States
United States
2013-10-1561891040METHOD OF MANUFACTURING HIGH RESISTIVITY SOI SUBSTRATE WITH REDUCED INTERFACE CONDUCTIVITYSunEdison, Inc.Provisional Application Expired
Jeffrey Louis Libbert
Shilpi Vajpayee
United States
United States
2013-10-03PCTUS2013063248UV TREATMENT OF POLISHED WAFERSSUNEDISON, INC.RO PROCESSING COMPLETED-PLACED IN STORAGE
LARRY W. SHIVE
SASHA J. KWESKIN
United States
United States
2013-06-2461838660FABRICATION OF INDIUM-DOPED SILICON BY THE CZOCHRALSKI METHODMEMC ELECTRONIC MATERIALS, INC.Provisional Application Expired
Jesse Samsonov Appel
Martin Jeffrey Binns
Roberto Scala
Luigi Bonanno
Stephan Haringer
Armando Giannattasio
Valentino Moser
United States
United States
Italy
Italy
Italy
Italy
Italy
2013-06-0561831452INSITU SNEEZE VALVE FOR CLEARING EXHAUST OF A CZOCHRALSKI GROWTH CHAMBERMEMC Electronic Materials, Inc.Provisional Application Expired
Deedra May Morgan
United States
2013-05-3161829685CENTER FLEX SINGLE SIDE POLISHING HEADMEMC Electronic Materials, Inc.Provisional Application Expired
Sumeet Bhagavat
Peter Albrecht
Alex Chu
Ichiro Yoshimura
Yunbiao Xin
Roland Vandamme
United States
United States
Taiwan
Japan
United States
United States
2013-05-2461827393METHODS FOR PRODUCING LOW OXYGEN SILICON INGOTSMEMC Electronic Materials, Inc.Provisional Application Expired
Soubir Basak
Carissima Marie Hudson
Gaurab Samanta
Jae-Woo Ryu
Hariprasad Sreedharamurthy
Kirk D. McCallum
United States
United States
United States
United States
United States
United States
2013-05-22PCTUS2013042267SOFT SWITCHING POWER CONVERTERSSUNEDISON, INC.RO PROCESSING COMPLETED-PLACED IN STORAGE
GREGORY ALLEN KERN
United States
2013-04-17PCTUS2013036972METHODS FOR PURIFYING HALOSILANE-CONTAINING STREAMSSUNEDISON, INC.RO PROCESSING COMPLETED-PLACED IN STORAGE
ZHIHUI GU
PUNEET GUPTA
GIANLUCA PAZZAGLIA
United States
United States
Italy
2013-04-09PCTUS2013035777SUSCEPTOR FOR IMPROVED EPITAXIAL WAFER FLATNESS AND METHODS FOR FABRICATING A SEMICONDUCTOR WAFER PROCESSING DEVICEMEMC ELECTRONIC MATERIALS, INC.RO PROCESSING COMPLETED-PLACED IN STORAGE
MANABU HAMANO
JOHN A. PITNEY
Japan
United States
2013-03-1561793999APPARATUS FOR PREPARING HETEROSTRUCTURES WITH REDUCED STRAIN BY RADIAL DISTENSION OR COMPRESSONMEMC Electronic Materials, Inc.Provisional Application Expired
Robert J. Falster
Vladimir V. Voronkov
John A. Pitney
Peter D. Albrecht
United Kingdom
Italy
United States
United States
2013-03-1561790445PROCESSES FOR PREPARING HETEROSTRUCTURES WITH REDUCED STRAIN BY RADIAL DISTENSION OR COMPRESSONMEMC ELECTRONIC MATERIALS, INC.Provisional Application Expired
Robert J. Falster
Vladimir V. Voronkov
Peter D. Albrecht
United Kingdom
Italy
United States
2013-03-1561788744APPARATUS FOR PREPARING HETEROSTRUCTURES WITH A REDUCED CONCENTRATION OF DEFECTSMEMC ELECTRONIC MATERIALS, INC.Provisional Application Expired
Robert J. Falster
Vladimir V. Voronkov
Peter D. Albrecht
United Kingdom
Italy
United States
2013-03-1461783928SEMICONDUCTOR-ON-INSULATOR WAFER MANUFACTURING METHOD FOR REDUCING LIGHT POINT DEFECTS AND SURFACE ROUGHNESSMEMC Electronic Materials, Inc.Provisional Application Expired
Qingmin Liu
Jeffrey L. Libbert
United States
United States
2013-02-26PCTUS2013027794A METHOD OF MANUFACTURING SILICON-ON-INSULATOR WAFERSMEMC ELECTRONIC MATERIALS, INC.RO PROCESSING COMPLETED-PLACED IN STORAGE
JEFFREY L. LIBBERT
GUOQIANG D. ZHANG
United States
United States
2013-02-1161763280Liner Assemblies For Chemical Vapor Deposition ChambersMEMC Electronic Materials, Inc.Provisional Application Expired
Arash Abedijaberi
Shawn Thomas
United States
United States
2013-01-25PCTUS2013023046QUALITATIVE CRYSTAL DEFECT EVALUATION METHODMEMC ELECTRONIC MATERIALS, INC.RO PROCESSING COMPLETED-PLACED IN STORAGE
PIL Y. HONG
JAE WOO RYU
United States
United States