MENTOR GRAPHICS CORP Patent Applications Pending
19 applications still open at the USPTO, newest filing first, as the USPTO Open Data Portal records them; the company is the first-named applicant. The application number opens the full record at Patent Center.
- 2019-12-09: Application 62945457; Invention Automated Two-Step Reference Trimming Based on Failed Bit Count; Applicant Mentor Graphics Corporation; Status Provisional Application Expired.
- 2019-12-09: Application 62945335; Invention Memory Built-In Self-Test Feedback For Reliable Memory Sensing; Applicant Mentor Graphics Corporation; Status Provisional Application Expired.
- 2019-12-09: Application 62945317; Invention Error-Correcting Code-Assisted Memory Repair; Applicant Mentor Graphics Corporation; Status Provisional Application Expired.
- 2019-11-21: Application 62938406; Invention Trajectory-Optimized Test Pattern Generation for Built-In Self-Test; Applicant Mentor Graphics Corporation; Status Provisional Application Expired.
| Filed | Application | Invention | Applicant | Status | Published as | Inventor name | Inventor country | Examiner |
|---|---|---|---|---|---|---|---|---|
| 2019-12-09 | 62945457 | Automated Two-Step Reference Trimming Based on Failed Bit Count | Mentor Graphics Corporation | Provisional Application Expired | Jongsin Yun Martin Keim | United States United States | ||
| 2019-12-09 | 62945335 | Memory Built-In Self-Test Feedback For Reliable Memory Sensing | Mentor Graphics Corporation | Provisional Application Expired | Jongsin Yun Benoit Nadeau-Dostie Martin Keim | United States Canada United States | ||
| 2019-12-09 | 62945317 | Error-Correcting Code-Assisted Memory Repair | Mentor Graphics Corporation | Provisional Application Expired | Benoit Nadeau-Dostie | Canada | ||
| 2019-11-21 | 62938406 | Trajectory-Optimized Test Pattern Generation for Built-In Self-Test | Mentor Graphics Corporation | Provisional Application Expired | Grzegorz Mrugalski Nilanjan Mukherjee Janusz Rajski Lukasz Rybak Jerzy Tyszer | Poland United States United States Poland Poland | ||
| 2019-11-14 | 62935256 | Layout-Friendly Test Pattern Decompressor | Mentor Graphics Corporation | Provisional Application Expired | Yu Huang Janusz Rajski Mark A. Kassab Nilanjan Mukherjee Jeffrey Mayer | United States United States United States United States United States | ||
| 2019-11-14 | 62935187 | Diagnostic Resolution Using Reversible Scan Chains | Mentor Graphics Corporation | Provisional Application Expired | Wu-Tung Cheng Szczepan Urban Jakub Janicki Manish Sharma Yu Huang | United States Poland Poland United States United States | ||
| 2019-07-29 | 62879589 | Reversible Multi-Bit Scan Cell-based Scan Chains For Improving Chain Diagnostic Resolution | Mentor Graphics Corporation | Provisional Application Expired | Wu-Tung Cheng Szczepan Urban Jakub Janicki Yu Huang Manish Sharma | United States Poland Poland United States United States | ||
| 2019-06-26 | 62866751 | DETERMINISTIC TEST PATTERN GENERATION FOR DESIGNS WITH TIMING EXCEPTIONS | Mentor Graphics Corporation | Provisional Application Expired | Wu-Tung Cheng Kun-Han Tsai Naixing Wang Chen Wang Xijiang Lin Mark A. Kassab Irith Pomeranz | United States United States United States United States United States United States United States | ||
| 2019-04-23 | 62837218 | Bi-directional shift scan cell architecture for improving scan chain diagnosis | Mentor Graphics Corporation | Provisional Application Expired | Wu-Tung Cheng Yu Huang | United States United States | ||
| 2019-04-23 | 62837215 | Low Pin Count Scan Architecture | Mentor Graphics Corporation | Provisional Application Expired | Wu-Tung Cheng Yu Huang | United States United States | ||
| 2019-04-19 | 62836105 | Optimized Scan Chain Diagnostic Pattern Generation For Reversible Scan Architecture | Mentor Graphics Corporation | Provisional Application Expired | Yu Huang Szczepan Urban Wu-Tung Cheng Manish Sharma | United States Poland United States United States | ||
| 2019-04-19 | 62836100 | Method and apparatus for compressing memory repair information of circuits containing identical blocks | Mentor Graphics Corporation | Provisional Application Expired | Benoit Nadeau-Dostie Luc Romain | Canada Canada | ||
| 2019-04-10 | 62831768 | Scan cell architecture for improving test coverage and test application time | Mentor Graphics Corporation | Provisional Application Expired | Nilanjan Mukherjee Jedrzej Solecki Janusz Rajski | United States United States United States | ||
| 2019-03-21 | PCTUS2019023279 | FLEXIBLE ISOMETRIC DECOMPRESSOR ARCHITECTURE FOR TEST COMPRESSION | MENTOR GRAPHICS CORPORATION | RO PROCESSING COMPLETED-PLACED IN STORAGE | JANUSZ RAJSKI JERZY TYSZER SYLWESTER MILEWSKI YU HUANG | United States Poland Poland United States | ||
| 2019-03-21 | PCTUS2019023278 | DETERMINISTIC STELLAR BUILT-IN SELF-TEST | MENTOR GRAPHICS CORPORATION | PCT - International Search Report Mailed to IB | YINGDI LIU JERZY TYSZER JANUSZ RAJSKI NILANJAN MUKHERJEE | United States Poland United States United States | THOMAS, SHANE M | |
| 2019-02-12 | 62804320 | Bi-directional shift scan cell architecture for improving scan chain diagnosis | Mentor Graphics Corporation | Provisional Application Expired | Wu-Tung Cheng Yu Huang | United States United States | ||
| 2019-02-08 | 62803090 | Die Yield Assessment Based On Pattern-Failure Rate Simulation | Mentor Graphics Corporation | Provisional Application Expired | Young Chang Kim John L. Sturtevant Andrew Burbine Christopher Clifford | Korea, Republic Of United States United States United States | ||
| 2019-01-30 | 62798530 | Enabling Fast Capture Staggered Groups Via Distributed On-Chip Clock Controllers | Mentor Graphics Corporation | Provisional Application Expired | Jean-Francois Cote | United States | ||
| 2019-01-18 | 62794067 | Machine learning-based parasitic extraction automation for circuit design and verification | Mentor Graphics Corporation | Provisional Application Expired | Vasileios Kourkoulos Rengjing Zhang Joshua Adkins | United States United States United States |