NOVA LTD. Active Patents
98 granted patents the USPTO still lists as patented, newest filing first, as the USPTO Open Data Portal records them; the company is the first-named applicant. The application number opens the full record at Patent Center.
- 2024-07-01: Application 18760099; Invention HYBRID METROLOGY METHOD AND SYSTEM; Applicant NOVA LTD; Status Patented Case.
- 2024-03-09: Application 18600698; Invention OPTICAL TECHNIQUE FOR MATERIAL CHARACTERIZATION; Applicant NOVA LTD.; Status Patented Case.
- 2024-03-04: Application 18595292; Invention OPTICAL PHASE MEASUREMENT METHOD AND SYSTEM; Applicant NOVA LTD.; Status Patented Case.
- 2024-02-07: Application 18435632; Invention RAMAN SPECTROSCOPY BASED MEASUREMENT SYSTEM; Applicant NOVA LTD.; Status Patented Case.
| Filed | Application | Invention | Applicant | Status | Granted | Patent | Published as | Inventor name | Inventor country | Examiner |
|---|---|---|---|---|---|---|---|---|---|---|
| 2024-07-01 | 18760099 | HYBRID METROLOGY METHOD AND SYSTEM | NOVA LTD | Patented Case | 2025-07-22 | 12366533 | US20250003882A1 | GILAD BARAK YANIR HAINICK YONATAN OREN | Israel Israel Israel | AYUB, HINA F |
| 2024-03-09 | 18600698 | OPTICAL TECHNIQUE FOR MATERIAL CHARACTERIZATION | NOVA LTD. | Patented Case | 2025-05-13 | 12298182 | US20240295436A1 | Gilad BARAK Yonatan OREN | Israel Israel | NUR, ABDULLAHI |
| 2024-03-04 | 18595292 | OPTICAL PHASE MEASUREMENT METHOD AND SYSTEM | NOVA LTD. | Patented Case | 2025-11-11 | 12467879 | US20240361253A1 | Gilad BARAK DANNY GROSSMAN Dror SHAFIR YOAV BERLATZKY Yanir HAINICK | Israel Israel Israel Israel Israel | BOLOGNA, DOMINIC JOSEPH |
| 2024-02-07 | 18435632 | RAMAN SPECTROSCOPY BASED MEASUREMENT SYSTEM | NOVA LTD. | Patented Case | 2025-11-11 | 12467869 | US20240302284A1 | Yonatan OREN | Israel | PEREZ-GUZMAN, CARLOS GABRIEL |
| 2024-01-29 | 18426319 | METHOD AND SYSTEM FOR OPTICAL CHARACTERIZATION OF PATTERNED SAMPLES | NOVA LTD. | Patented Case | 2026-09-22 | 12742724 | US20240337590A1 | Dror SHAFIR Gilad BARAK Shay WOLFLING Michal Haim YACHINI Matthew SENDELBACH Cornel BOZDOG | Israel Israel Israel Israel United States United States | NGUYEN, SANG H |
| 2024-01-03 | 18403654 | OPTICAL METROLOGY SYSTEM AND METHOD | NOVA LTD. | Patented Case | 2025-07-15 | 12360462 | US20240264538A1 | Gilad BARAK Amir Shayari | Israel Israel | DINH, LYNDA |
| 2024-01-02 | 18402708 | ACCURATE RAMAN SPECTROSCOPY | NOVA LTD. | Patented Case | 2025-07-29 | 12372473 | US20240210322A1 | Eyal Hollander Gilad BARAK Elad Schleifer Yonatan OREN Amir Shayari | Israel Israel Israel Israel Israel | NUR, ABDULLAHI |
| 2023-11-13 | 18508177 | MACHINE AND DEEP LEARNING METHODS FOR SPECTRA-BASED METROLOGY AND PROCESS CONTROL | NOVA LTD. | Patented Case | 2025-06-03 | 12321102 | US20240310737A1 | Barak BRINGOLTZ Ran YACOBY Noam TAL Shay YOGEV Boaz STURLESI Oded COHEN | Israel Israel Israel Israel Israel Israel | PAN, YUHUI R |
| 2023-09-18 | 18369221 | METROLOGY AND PROCESS CONTROL FOR SEMICONDUCTOR MANUFACTURING | NOVA LTD | Patented Case | 2025-02-25 | 12236364 | US20240078450A1 | EITAN ROTHSTEIN ILYA RUBINOVICH NOAM TAL BARAK BRINGOLTZ YONGHA KIM ARIEL BROITMAN ODED COHEN EYLON RABINOVICH TAL ZAHARONI SHAY YOGEV DANIEL KANDEL | Israel Israel Israel Israel Israel Israel Israel Israel Israel Israel Israel | AKANBI, ISIAKA O |
| 2023-08-18 | 18452494 | ACCURATE RAMAN SPECTROSCOPY | NOVA LTD. | Patented Case | 2024-12-10 | 12163892 | US20240085333A1 | Elad Schleifer Yonatan Oren Amir Shayari Eyal Hollander Valery Deich Shimon YALOV Gilad BARAK | Israel Israel Israel Israel Israel Israel Israel | NUR, ABDULLAHI |
| 2023-07-27 | 18263305 | TIME-DOMAIN OPTICAL METROLOGY AND INSPECTION OF SEMICONDUCTOR DEVICES | NOVA LTD. | Patented Case | 2026-07-14 | 12680964 | US20240085805A1 | Gilad BARAK Amir Sagiv Yishai Schreiber Jacob Ofek Zvi Gorohovsky Daphna Peimer | Israel Israel Israel Israel Israel Israel | CHOWDHURY, TARIFUR RASHID |
| 2023-07-03 | 18346778 | X-RAY BASED MEASUREMENTS IN PATTERNED STRUCTURE | NOVA LTD. | Patented Case | 2025-01-14 | 12196691 | US20240044819A1 | Gilad BARAK | Israel | CHEN, ZHITONG |
| 2023-03-14 | 18245161 | ACCURATE RAMAN SPECTROSCOPY | NOVA LTD. | Patented Case | 2024-11-26 | 12152993 | US20240019375A1 | Eyal Hollander Gilad BARAK Elad Schleifer Yonatan OREN Amir Shayari | Israel Israel Israel Israel Israel | NUR, ABDULLAHI |
| 2023-02-27 | 18043331 | Imaging metrology | NOVA LTD. | Patented Case | 2025-12-16 | 12498332 | US20230280283A1 | Igor TUROVETS Shimon YALOV Alex Shichtman Misha Matusovsky Shachar PAZ | Israel Israel Israel Israel Israel | NGUYEN, HUNG |
| 2022-12-29 | 18003801 | SYSTEMS AND METHODS FOR OPTICAL METROLOGY | NOVA LTD. | Patented Case | 2025-07-15 | 12359968 | US20230296436A1 | Yonatan OREN Eyal Hollander Elad Schleifer Gilad BARAK | Israel Israel Israel Israel | AYUB, HINA F |
| 2022-12-29 | 18003691 | System and method for controlling measurements of sample's parameters | NOVA LTD. | Patented Case | 2024-01-16 | 11874606 | US20230185203A1 | Barak BRINGOLTZ Ofer SHLAGMAN Ran YACOBY Noam TAL | Israel Israel Israel Israel | ASFAW, MESFIN T |
| 2022-12-28 | 18147682 | OPTICAL TECHNIQUE FOR MATERIAL CHARACTERIZATION | NOVA LTD. | Patented Case | 2024-03-12 | 11927481 | US20230296434A1 | Gilad BARAK Yonatan OREN | Israel Israel | NUR, ABDULLAHI |
| 2022-10-06 | 17995706 | MACHINE AND DEEP LEARNING METHODS FOR SPECTRA-BASED METROLOGY AND PROCESS CONTROL | NOVA LTD. | Patented Case | 2023-11-14 | 11815819 | US20230124431A1 | Barak BRINGOLTZ Ran YACOBY Noam TAL Shay YOGEV Boaz STURLESI Oded COHEN | Israel Israel Israel Israel Israel Israel | PAN, YUHUI R |
| 2022-09-27 | 17935930 | OPTICAL PHASE MEASUREMENT SYSTEM AND METHOD | NOVA LTD. | Patented Case | 2024-04-02 | 11946875 | US20230130231A1 | Gilad BARAK Dror SHAFIR Yanir HAINICK Shahar Gov | Israel Israel Israel Israel | AYUB, HINA F |
| 2022-08-24 | 17904950 | OPTICAL METROLOGY SYSTEM AND METHOD | NOVA LTD. | Patented Case | 2024-01-09 | 11868054 | US20230124422A1 | Gilad BARAK Amir Shayari | Israel Israel | DINH, LYNDA |
| 2022-08-01 | 17816713 | ACCURATE RAMAN SPECTROSCOPY | NOVA LTD. | Patented Case | 2024-01-02 | 11860104 | US20230168200A1 | Eyal Hollander Gilad BARAK Elad Schleifer Yonatan OREN Amir Shayari | Israel Israel Israel Israel Israel | NUR, ABDULLAHI |
| 2022-07-18 | 17759031 | ACCURATE RAMAN SPECTROSCOPY | NOVA LTD. | Patented Case | 2023-08-29 | 11740183 | US20230044886A1 | Elad Schleifer Yonatan Oren Amir Shayari Eyal Hollander Valery Deich Shimon YALOV Gilad BARAK | Israel Israel Israel Israel Israel Israel Israel | NUR, ABDULLAHI |
| 2022-07-06 | 17790962 | DETECTING OUTLIERS AND ANOMALIES FOR OCD METROLOGY MACHINE LEARNING | NOVA LTD | Patented Case | 2024-07-16 | 12038271 | US20230017097A1 | EITAN A. ROTHSTEIN YONGHA KIM ILYA RUBINOVICH ARIEL BROITMAN OLGA KRASNYKOV BARAK BRINGOLTZ | Israel Israel Israel Israel Israel Israel | DINH, LYNDA |
| 2022-07-05 | 17790765 | SELF-SUPERVISED REPRESENTATION LEARNING FOR INTERPRETATION OF OCD DATA | NOVA LTD | Patented Case | 2023-09-05 | 11747740 | US20230014976A1 | RAN YACOBY BOAZ STURLESI | Israel Israel | AIELLO, JEFFREY P |
| 2022-07-05 | 17758398 | COMBINING PHYSICAL MODELING AND MACINE LEARNING | NOVA LTD. | Patented Case | 2026-02-10 | 12547082 | US20230023634A1 | Barak BRINGOLTZ Ran YACOBY Ofer SHLAGMAN Boaz STURLESI | Israel Israel Israel Israel | GARBOWSKI, LEIGH M |
| 2022-06-27 | 17758067 | COMBINED OCD AND PHOTOREFLECTANCE METHOD AND SYSTEM | NOVA LTD. | Patented Case | 2025-08-19 | 12392733 | US20230035404A1 | Yonatan OREN Gilad BARAK | Israel Israel | STOCK JR, GORDON J |
| 2022-06-11 | 17757224 | METHOD AND SYSTEM FOR BROADBAND PHOTOREFLECTANCE SPECTROSCOPY | NOVA LTD. | Patented Case | 2023-10-31 | 11802829 | US20230003637A1 | Yonatan OREN Gilad BARAK | Israel Israel | AKANBI, ISIAKA O |
| 2022-04-18 | 17722421 | TEM-BASED METROLOGY METHOD AND SYSTEM | NOVA LTD | Patented Case | 2023-07-25 | 11710616 | US20220310356A1 | VLADIMIR MACHAVARIANI MICHAEL SHIFRIN DANIEL KANDEL VICTOR KUCHEROV IGOR ZISELMAN RONEN URENSKI MATTHEW SENDELBACH | Israel Israel Israel Israel Israel Israel United States | NGUYEN, KIET TUAN |
| 2022-04-05 | 17714035 | RAMAN SPECTROSCOPY BASED MEASUREMENT SYSTEM | NOVA LTD | Patented Case | 2024-02-20 | 11906434 | US20220373465A1 | Yonatan OREN | Israel | PEREZ-GUZMAN, CARLOS GABRIEL |
| 2022-03-15 | 17694782 | RAMAN SPECTROSCOPY BASED MEASUREMENTS IN PATTERNED STRUCTURES | NOVA LTD. | Patented Case | 2024-08-20 | 12066385 | US20220326159A1 | Gilad Barak Yanir HAINICK Yonatan OREN Vladimir Machavariani | Israel Israel Israel Israel | BOLOGNA, DOMINIC JOSEPH |
| 2021-11-02 | 17453338 | Monitoring system and method for verifying measurements in pattened structures | NOVA LTD. | Patented Case | 2024-11-26 | 12152869 | US20220163320A1 | Boaz Brill Boris Sherman Igor Turovets | Israel Israel Israel | SCHECHTER, ANDREW M |
| 2021-10-28 | 17607044 | SEMICONDUCTOR DEVICE MANUFACTURE WITH IN-LINE HOTSPOT DETECTION | NOVA LTD | Patented Case | 2024-08-06 | 12057355 | US20220208620A1 | MICHAEL SHIFRIN AVRON GER | Israel Israel | DINH, PAUL |
| 2021-10-19 | 17504547 | HYBRID METROLOGY METHOD AND SYSTEM | NOVA LTD | Patented Case | 2024-07-02 | 12025560 | US20220120690A1 | GILAD BARAK YANIR HAINICK YONATAN OREN | Israel Israel Israel | AYUB, HINA F |
| 2021-10-11 | 17498013 | TEST STRUCTURE DESIGN FOR METROLOGY MEASUREMENTS IN PATTERNED SAMPLES | NOVA LTD | Patented Case | 2023-05-02 | 11639901 | US20220099596A1 | GILAD BARAK ODED COHEN IGOR TUROVETS | Israel Israel Israel | STOCK JR, GORDON J |
| 2021-08-23 | 17445727 | LAYER DETECTION FOR HIGH ASPECT RATIO ETCH CONTROL | NOVA LTD. | Patented Case | 2024-03-12 | 11929291 | US20220044975A1 | Gil Loewenthal Shay Yogev Yoav Etzioni | Israel Israel Israel | TRAN, BINH X |
| 2021-08-23 | 17445721 | X-RAY BASED MEASUREMENTS IN PATTERNED STRUCTURE | NOVA LTD. | Patented Case | 2023-07-04 | 11692953 | US20220042934A1 | Gilad Barak | Israel | CHEN, ZHITONG |
| 2021-08-12 | 17400157 | METROLOGY AND PROCESS CONTROL FOR SEMICONDUCTOR MANUFACTURING | NOVA LTD | Patented Case | 2023-09-19 | 11763181 | US20220036218A1 | EITAN ROTHSTEIN ILYA RUBINOVICH NOAM TAL BARAK BRINGOLTZ YONGHA KIM ARIEL BROITMAN ODED COHEN EYLON RABINOVICH TAL ZAHARONI SHAY YOGEV DANIEL KANDEL | Israel Israel Israel Israel Israel Israel Israel Israel Israel Israel Israel | AKANBI, ISIAKA O |
| 2021-05-18 | 17309318 | INTEGRATED MEASUREMENT SYSTEM | NOVA LTD. | Patented Case | 2024-05-28 | 11994374 | US20210396511A1 | Elad DOTAN Moshe VANHOTSKER Shimon YALOV Valery DEICH Roi RINGEL Beni SHULMAN Yosi BAR ON Shahar BASSAN | Israel Israel Israel Israel Israel Israel Israel Israel | STOCK JR, GORDON J |
| 2021-04-06 | 17301548 | SCATTEROMETRY SYSTEM AND METHOD | NOVA LTD. | Patented Case | 2024-02-13 | 11900028 | US20210294942A1 | Ruslan BERDICHEVSKY Eyal Grubner Shai Segev | Israel Israel Israel | JOHANSEN, JOHN E |
| 2021-02-09 | 17170938 | TEM-BASED METROLOGY METHOD AND SYSTEM | NOVA LTD. | Patented Case | 2022-04-19 | 11309162 | US20210217581A1 | VLADIMIR MACHAVARIANI MICHAEL SHIFRIN DANIEL KANDEL VICTOR KUCHEROV IGOR ZISELMAN RONEN URENSKI MATTHEW SENDELBACH | Israel Israel Israel Israel Israel Israel United States | NGUYEN, KIET TUAN |
| 2021-01-25 | 17263147 | OPTICAL TECHNIQUE FOR MATERIAL CHARACTERIZATION | NOVA LTD. | Patented Case | 2023-01-03 | 11543294 | US20210293618A1 | Gilad Barak Yonatan OREN | Israel Israel | NUR, ABDULLAHI |
| 2020-12-28 | 17135924 | METHOD AND SYSTEM FOR OPTICAL CHARACTERIZATION OF PATTERNED SAMPLES | NOVA LTD. | Patented Case | 2024-01-30 | 11885737 | US20210116359A1 | Dror SHAFIR Gilad Barak Shay WOLFLING Michal Haim YACHINI Matthew SENDELBACH Cornel BOZDOG | Israel Israel Israel Israel United States United States | PRIETO, VIOLETA A |
| 2020-12-21 | 17254357 | TIME-DOMAIN OPTICAL METROLOGY AND INSPECTION OF SEMICONDUCTOR DEVICES | NOVA Ltd. | Patented Case | 2022-06-21 | 11366398 | US20210247699A1 | GILAD BARAK MICHAEL CHEMAMA SMADAR FERBER YANIR HAINICK BORIS LEVANT ZE'EV LINDENFELD DROR SHAFIR YURI SHIRMAN ELAD SCHLEIFER | Israel Israel Israel Israel Israel Israel Israel Israel Israel | BRYANT, REBECCA CAROLE |
| 2020-12-08 | 16973092 | METROLOGY AND PROCESS CONTROL FOR SEMICONDUCTOR MANUFACTURING | NOVA MEASURING INSTRUMENTS LTD. | Patented Case | 2021-08-17 | 11093840 | US20210150387A1 | EITAN ROTHSTEIN ILYA RUBINOVICH NOAM TAL BARAK BRINGOLTZ YONGHA KIM ARIEL BROITMAN ODED COHEN EYLON RABINOVICH TAL ZAHARONI SHAY YOGEV DANIEL KANDEL | Israel Israel Israel Israel Israel Israel Israel Israel Israel Israel Israel | AKANBI, ISIAKA O |
| 2020-09-14 | 17020587 | ACCURATE RAMAN SPECTROSCOPY | NOVA LTD. | Patented Case | 2022-08-16 | 11415519 | US20210223179A1 | Eyal Hollander Gilad Barak Elad Schleifer Yonatan OREN Amir Shayari | Israel Israel Israel Israel Israel | NUR, ABDULLAHI |
| 2020-08-03 | 16945975 | HYBRID METROLOGY METHOD AND SYSTEM | NOVA LTD. | Patented Case | 2021-10-19 | 11150190 | US20210003508A1 | GILAD BARAK YANIR HAINICK YONATAN OREN | Israel Israel Israel | DECENZO, SHAWN H |
| 2020-05-26 | 16882784 | OPTICAL PHASE MEASUREMENT SYSTEM AND METHOD | NOVA LTD. | Patented Case | 2022-10-04 | 11460415 | US20200355622A1 | GILAD BARAK DROR SHAFIR YANIR HAINICK SHAHAR GOV | Israel Israel Israel Israel | AYUB, HINA F |
| 2020-03-25 | 16650405 | METROLOGY METHOD AND SYSTEM | NOVA LTD. | Patented Case | 2022-09-20 | 11450541 | US20200294829A1 | VLADIMIR MACHAVARIANI MICHAEL SHIFRIN DANIEL KANDEL VICTOR KUCHEROV IGOR ZISELMAN RONEN URENSKI MATTHEW SENDELBACH | Israel Israel Israel Israel Israel Israel United States | GAWORECKI, MARK R |
| 2020-02-18 | 16792937 | RAMAN SPECTROSCOPY BASED MEASUREMENTS IN PATTERNED STRUCTURES | NOVA LTD | Patented Case | 2022-03-15 | 11275027 | US20200256799A1 | GILAD BARAK YANIR HAINICK YONATAN OREN VLADIMIR MACHAVARIANI | Israel Israel Israel Israel | BOLOGNA, DOMINIC JOSEPH |
| 2019-11-14 | 16613448 | RAMAN SPECTROSCOPY BASED MEASUREMENT SYSTEM | NOVA LTD | Patented Case | 2022-04-05 | 11293871 | US20210164906A1 | Yonatan OREN | Israel | DECENZO, SHAWN H |
| 2019-09-02 | 16558212 | TEST STRUCTURE DESIGN FOR METROLOGY MEASUREMENTS IN PATTERNED SAMPLES | NOVA LTD. | Patented Case | 2021-10-12 | 11143601 | US20200057005A1 | GILAD BARAK ODED COHEN IGOR TUROVETS | Israel Israel Israel | STOCK JR, GORDON J |
| 2019-08-27 | 16488974 | TEM-BASED METROLOGY METHOD AND SYSTEM | NOVA MEASURING INSTRUMENTS LTD. | Patented Case | 2021-02-09 | 10916404 | US20190393016A1 | VLADIMIR MACHAVARIANI MICHAEL SHIFRIN DANIEL KANDEL VICTOR KUCHEROV IGOR ZISELMAN RONEN URENSKI MATTHEW SENDELBACH | Israel Israel Israel Israel Israel Israel United States | NGUYEN, KIET TUAN |
| 2019-08-27 | 16488967 | AN APPARATUS AND METHOD FOR ELECTRICAL TEST PREDICTION | NOVA LTD. | Patented Case | 2022-05-17 | 11335612 | US20200006165A1 | IGOR TUROVETS | Israel | RHODES-VIVOUR, TEMILADE S |
| 2019-07-30 | 16525619 | SCATTEROMETRY SYSTEM AND METHOD | NOVA MEASURING INSTRUMENTS LTD. | Patented Case | 2021-04-06 | 10970435 | US20200019658A1 | RUSLAN BERDICHEVSKY EYAL GRUBNER SHAI SEGEV | Israel Israel Israel | JOHANSEN, JOHN E |
| 2019-07-29 | 16524296 | OPTICAL PHASE MEASUREMENT SYSTEM AND METHOD | NOVA MEASURING INSTRUMENTS LTD. | Patented Case | 2020-05-26 | 10663408 | US20200025693A1 | GILAD BARAK DROR SHAFIR YANIR HAINICK SHAHAR GOV | Israel Israel Israel Israel | AYUB, HINA F |
| 2019-06-27 | 16454242 | PROCESS CONTROL OF SEMICONDUCTOR FABRICATION BASED ON SPECTRA QUALITY METRICS | NOVA LTD. GLOBALFOUNDRIES INC. | Patented Case | 2022-04-12 | 11300948 | US20200409345A1 | TAHER KAGALWALA ALOK VAID SHAY YOGEV MATTHEW SENDELBACH PAUL ISBESTER YOAV ETZIONI | United States United States Israel United States United States Israel | TANG, MICHAEL XUEFEI |
| 2019-05-20 | 16462247 | OPTICAL SYSTEM AND METHOD FOR MEASURING PARAMETERS OF PATTERNED STRUCTURES IN MICRO-ELECTRONIC DEVICES | NOVA LTD. | Patented Case | 2022-11-29 | 11512943 | US20190339068A1 | DANNY GROSSMAN SHAHAR GOV MOSHE VANHOTSKER GUY ENGEL ELAD DOTAN | Israel Israel Israel Israel Israel | AYUB, HINA F |
| 2019-05-13 | 16349287 | LAYER DETECTION FOR HIGH ASPECT RATIO ETCH CONTROL | NOVA LTD. | Patented Case | 2021-08-31 | 11107738 | US20200194320A1 | GIL LOEWENTHAL SHAY YOGEV YOAV ETZIONI | Israel Israel Israel | TRAN, BINH X |
| 2019-04-30 | 16398297 | METHOD AND SYSTEM FOR OPTICAL METROLOGY IN PATTERNED STRUCTURES | NOVA MEASURING INSTRUMENTS LTD. | Patented Case | 2020-09-01 | 10761036 | US20190317024A1 | Boris Levant Yanir Hainick Vladimir Machavariani Roy Koret Gilad Barak | Israel Israel Israel Israel Israel | HAGOS, EYOB |
| 2018-12-24 | 16231718 | OPTICAL PHASE MEASUREMENT METHOD AND SYSTEM | NOVA MEASURING INSTRUMENTS LTD. | Patented Case | 2021-06-08 | 11029258 | US20190154594A1 | GILAD BARAK DANNY GROSSMAN DROR SHAFIR YOAV BERLATZKY YANIR HAINICK | Israel Israel Israel Israel Israel | BOLOGNA, DOMINIC JOSEPH |
| 2018-12-17 | 16221631 | MEASURING COMPLEX STRUCTURES IN SEMICONDUCTOR FABRICATION | NOVA MEASURING INSTRUMENTS LTD. GLOBALFOUNDRIES INC. | Patented Case | 2020-05-26 | 10664638 | US20200192987A1 | TAHER KAGALWALA SRIDHAR MAHENDRAKAR MATTHEW SENDELBACH ALOK VAID | United States United States United States United States | DINH, PAUL |
| 2018-10-18 | 16094547 | OPTICAL SYSTEM AND METHOD FOR MEASUREMENTS OF SAMPLES | NOVA MEASURING INSTRUMENTS LTD. | Patented Case | 2020-08-11 | 10739277 | US20190128823A1 | Yoav BERLATZKY Valery DEICH Dror SHAFIR Danny GROSSMAN | Israel Israel Israel Israel | BOLOGNA, DOMINIC JOSEPH |
| 2018-08-02 | 16053210 | OPTICAL CRITICAL DIMENSION METROLOGY | NOVA MEASURING INSTRUMENTS LTD. | Patented Case | 2019-07-30 | 10365163 | US20190063999A1 | Gilad BARAK Dror SHAFIR Danny GROSSMAN | Israel Israel Israel | AYUB, HINA F |
| 2018-07-23 | 16042448 | METHOD AND SYSTEM FOR OPTICAL CHARACTERIZATION OF PATTERNED SAMPLES | Nova Measuring Instruments Ltd. | Patented Case | 2020-12-29 | 10876959 | US20180328837A1 | Dror SHAFIR Gilad BARAK Shay WOLFLING Michal Haim YACHINI Matthew SENDELBACH Cornel BOZDOG | Israel Israel Israel Israel United States United States | PRIETO, VIOLETA A |
| 2018-07-17 | 16037161 | X-RAY BASED MEASUREMENTS IN PATTERNED STRUCTURE | Nova Measuring Instruments Ltd. | Patented Case | 2021-08-24 | 11099142 | US20190033236A1 | Gilad BARAK | Israel | CHEN, ZHITONG |
| 2018-06-29 | 16067202 | METHOD AND SYSTEM FOR PROCESSING PATTERNED STRUCTURES | NOVA MEASURING INSTRUMENTS LTD. | Patented Case | 2021-04-13 | 10978321 | US20190027386A1 | Igor TUROVETS | Israel | NGUYEN, DUNG V |
| 2018-06-14 | 16062127 | HYBRID METROLOGY METHOD AND SYSTEM | NOVA MEASURING INSTRUMENTS LTD. | Patented Case | 2020-08-04 | 10732116 | US20180372645A1 | GILAD BARAK YANIR HAINICK YONATAN OREN | Israel Israel Israel | DECENZO, SHAWN H |
| 2018-06-14 | 16062114 | RAMAN SPECTROSCOPY BASED MEASUREMENTS IN PATTERNED STRUCTURES | NOVA MEASURING INSTRUMENTS LTD. | Patented Case | 2020-02-18 | 10564106 | US20180372644A1 | GILAD BARAK YANIR HAINICK YONATAN OREN VLADIMIR MACHAVARIANI | Israel Israel Israel Israel | BOLOGNA, DOMINIC JOSEPH |
| 2018-03-08 | 15915613 | OPTICAL METROLOGY FOR IN-SITU MEASUREMENTS | NOVA MEASURING INSTRUMENTS LTD. | Patented Case | 2019-02-05 | 10197506 | US20180195975A1 | Igor TUROVETS Cornel BOZDOG Dario ELYASI | Israel United States Israel | AHMED, JAMIL |
| 2018-01-10 | 15866768 | OPTICAL PHASE MEASUREMENT METHOD AND SYSTEM | NOVA MEASURING INSTRUMENTS LTD. | Patented Case | 2019-07-30 | 10365231 | US20180128753A1 | Gilad BARAK Dror SHAFIR Yanir HAINICK Shahar GOV | Israel Israel Israel Israel | AYUB, HINA F |
| 2017-12-22 | 15739250 | METHOD FOR USE IN PROCESS CONTROL OF MANUFACTURE OF PATTERNED SAMPLE | NOVA MEASURING INSTRUMENTS LTD. | Patented Case | 2020-01-14 | 10534275 | US20180196356A1 | Cornel BOZDOG Aron CEPLER Paul ISBESTER | United States United States United States | BAYAT, ALI |
| 2017-06-08 | 15534187 | TEST STRUCTURE FOR USE IN METROLOGY MEASUREMENTS OF PATTERNS | NOVA MEASURING INSTRUMENTS LTD. | Patented Case | 2019-02-26 | 10216098 | US20170363970A1 | Oded COHEN Gilad BARAK Igor TUROVETS | Israel Israel Israel | YOUNG, CHRISTOPHER G |
| 2017-05-02 | 15523896 | METHOD AND SYSTEM FOR OPTICAL METROLOGY IN PATTERNED STRUCTURES | NOVA MEASURING INSTRUMENTS LTD. | Patented Case | 2019-04-30 | 10274435 | US20180052119A1 | Boris LEVANT Yanir HAINICK Vladimir MACHAVARIANI Roy KORET Gilad BARAK | Israel Israel Israel Israel Israel | HAGOS, EYOB |
| 2017-02-13 | 15430568 | PROCESS CONTROL USING NON-ZERO ORDER DIFFRACTION | NOVA MEASURING INSTRUMENTS LTD. | Patented Case | 2018-08-14 | 10048595 | US20170205716A1 | BOAZ BRILL | Israel | KREUTZER, COLIN WRIGHT |
| 2017-02-07 | 15502329 | METROLOGY TEST STRUCTURE DESIGN AND MEASUREMENT SCHEME FOR MEASURING IN PATTERNED STRUCTURES | NOVA MEASURING INSTRUMENTS LTD. | Patented Case | 2019-07-23 | 10359369 | US20170227474A1 | Gilad BARAK Oded COHEN | Israel Israel | MERLINO, AMANDA H |
| 2017-01-12 | 15325877 | OPTICAL METHOD AND SYSTEM FOR DEFECTS DETECTION IN THREE-DIMENSIONAL STRUCTURES | NOVA MEASURING INSTRUMENTS LTD. | Patented Case | 2018-07-10 | 10018574 | US20170138868A1 | Gilad BARAK Elad DOTAN Alon BELLELI | Israel Israel Israel | NGUYEN, SANG H |
| 2016-12-20 | 15385495 | OPTICAL METROLOGY FOR IN-SITU MEASUREMENTS | NOVA MEASURING INSTRUMENTS LTD. | Patented Case | 2018-03-13 | 9915624 | US20170167987A1 | Igor TUROVETS Cornel BOZDOG Dario ELYASI | Israel United States Israel | AHMED, JAMIL |
| 2016-10-05 | 15285892 | METHOD AND SYSTEM FOR IMPROVING OPTICAL MEASUREMENTS ON SMALL TARGETS | NOVA MEASURING INSTRUMENTS LTD. | Patented Case | 2018-03-27 | 9927370 | US20170089842A1 | Danny GROSSMAN Guy SELICKTER | Israel Israel | RAHMAN, MD M |
| 2016-09-29 | 15300768 | OPTICAL PHASE MEASUREMENT METHOD AND SYSTEM | Nova Measuring Instruments Ltd. | Patented Case | 2018-12-25 | 10161885 | US20170016835A1 | Gilad BARAK Danny GROSSMAN Dror SHAFIR Yoav BERLATZKY Yanir HAINICK | Israel Israel Israel Israel Israel | BOLOGNA, DOMINIC JOSEPH |
| 2016-09-08 | 15124445 | TEST STRUCTURES AND METROLOGY TECHNIQUE UTILIZING THE TEST STRUCTURES FOR MEASURING IN PATTERNED STRUCTURES | NOVA MEASURING INSTRUMENTS LTD. | Patented Case | 2018-09-04 | 10066936 | US20170023357A1 | Igor TUROVETS | Israel | NGUYEN, DUY T V |
| 2016-08-25 | 15121479 | METHOD AND SYSTEM FOR PLANNING METROLOGY MEASUREMENTS | NOVA MEASURING INSTRUMENTS LTD. | Patented Case | 2019-03-05 | 10222710 | US20160363872A1 | Matthew SENDELBACH Niv SARIG Charles N. ARCHIE | United States Israel United States | HENSON, MISCHITA L |
| 2016-08-23 | 15120847 | OPTICAL CRITICAL DIMENSION METROLOGY | NOVA MEASURING INSTRUMENTS LTD. | Patented Case | 2018-08-07 | 10041838 | US20160363484A1 | Gilad BARAK Dror SHAFIR Danny GROSSMAN | Israel Israel Israel | AYUB, HINA F |
| 2016-08-16 | 15119306 | OVERLAY DESIGN OPTIMIZATION | NOVA MEASURING INSTRUMENTS LTD. | Patented Case | 2019-06-04 | 10311198 | US20170061066A1 | Gilad BARAK Tal VERDENE Michal YACHINI Dror SHAFIR Changman MOON Shay WOLFLING | Israel Israel Israel Israel Korea, Republic Of Israel | ROSSOSHEK, YELENA |
| 2016-08-04 | 15228772 | MEASUREMENT SYSTEM AND METHOD FOR MEASURING IN THIN FILMS | Nova Measuring Instruments Ltd. GLOBALFOUNDRIES, Inc. | Patented Case | 2018-07-24 | 10030971 | US20170038201A1 | Cornel Bozdog Alok Vaid Sridhar Mahendrakar Mainul Hossain Taher Kagalwala | United States United States United States United States United States | GAWORECKI, MARK R |
| 2016-06-29 | 15108855 | SURFACE PLANARIZATION SYSTEM AND METHOD | NOVA MEASURING INSTRUMENTS LTD. | Patented Case | 2019-03-12 | 10226852 | US20160318148A1 | Igor TUROVETS | Israel | MACARTHUR, SYLVIA |
| 2016-05-20 | 15038081 | Assembly for producing a plurality of beam bundles | NOVA MEASURING INSTRUMENTS LTD. | Patented Case | 2018-10-30 | 10113711 | US20160305632A1 | Stefan FRANZ | Germany | SAWHNEY, HARGOBIND S |
| 2016-02-23 | 15050613 | METHOD AND SYSTEM FOR OPTIMIZING OPTICAL INSPECTION OF PATTERNED STRUCTURES | NOVA MEASURING INSTRUMENTS LTD. | Patented Case | 2018-02-27 | 9904993 | US20160284077A1 | Boaz BRILL | Israel | CONNER, SEAN M |
| 2016-01-08 | 14903629 | METHOD AND SYSTEM FOR DETERMINING STRAIN DISTRIBUTION IN A SAMPLE | NOVA MEASURING INSTRUMENTS LTD. | Patented Case | 2019-02-19 | 10209206 | US20160139065A1 | Gilad BARAK Shay WOLFLING Cornel BOZDOG Matthew SENDELBACH | Israel Israel United States United States | FOX, DANIELLE A |
| 2015-10-30 | 14927850 | SCATTEROMETRY SYSTEM AND METHOD | Nova Measuring Instruments Ltd. | Patented Case | 2019-08-06 | 10372845 | Ruslan BERDICHEVSKY Eyal GRUBNER Shai SEGEV | Israel Israel Israel | JOHANSEN, JOHN E | |
| 2015-10-21 | 14785896 | METHOD AND SYSTEM FOR IMPROVING OPTICAL MEASUREMENTS ON SMALL TARGETS | NOVA MEASURING INSTRUMENTS LTD. | Patented Case | 2016-10-25 | 9476837 | US20160084773A1 | Danny GROSSMAN Guy SELICKTER | Israel Israel | RAHMAN, MD M |
| 2015-08-20 | 14769170 | OPTICAL PHASE MEASUREMENT METHOD AND SYSTEM | NOVA MEASURING INSTRUMENTS LTD. | Patented Case | 2018-02-20 | 9897553 | US20150377799A1 | Gilad BARAK Dror SHAFIR Yanir HAINICK Shahar GOV | Israel Israel Israel Israel | AYUB, HINA F |
| 2015-06-26 | 14655791 | OPTICAL METHOD AND SYSTEM FOR CRITICAL DIMENSIONS AND THICKNESS CHARACTERIZATION | NOVA MEASURING INSTRUMENTS LTD. | Patented Case | 2018-08-21 | 10054423 | US20150345934A1 | Dror SHAFIR Gilad BARAK Shay WOLFLING | Israel Israel Israel | NIXON, OMAR H |
| 2015-02-18 | 14422190 | OPTICAL METROLOGY FOR IN-SITU MEASUREMENTS | NOVA MEASURING INSTRUMENTS LTD. | Patented Case | 2016-12-27 | 9528946 | US20150226680A1 | Igor Turovets Cornel Bozdog Dario Elyasi | Israel United States Israel | AHMED, JAMIL |
| 2015-01-23 | 14416723 | OPTICAL METHOD AND SYSTEM FOR MEASURING ISOLATED FEATURES OF A STRUCTURE | NOVA MEASURING INSTRUMENTS LTD. | Patented Case | 2018-09-11 | 10073045 | US20150212012A1 | Gilad Barak Yanir Hainick Dror Shafir | Israel Israel Israel | HENSON, MISCHITA L |
| 2015-01-02 | 14412479 | OPTICAL METHOD AND SYSTEM FOR DETECTING DEFECTS IN THREE-DIMENSIONAL STRUCTURES | NOVA MEASURING INSTRUMENTS LTD. | Patented Case | 2017-05-16 | 9651498 | US20150192527A1 | Gilad Barak Elad Dotan Alon Belleli | Israel Israel Israel | AYUB, HINA F |
| 2013-12-24 | 14139913 | METHOD AND SYSTEM FOR USE IN MONITORING PROPERTIES OF PATTERNED STRUCTURES | NOVA MEASURING INSTRUMENTS LTD. | Patented Case | 2015-02-24 | 8964178 | US20140142869A1 | Yoel COHEN Boaz BRILL | Israel Israel | NGUYEN, SANG H |
| 2013-09-09 | 14021010 | OPTICAL SYSTEM AND METHOD FOR MEASUREMENT OF ONE OR MORE PARAMETERS OF VIA-HOLES | Nova Measuring Instruments Ltd. | Patented Case | 2015-09-22 | 9140539 | US20140376006A1 | DAVID SCHEINER | Israel | NGUYEN, SANG H |
| 2012-10-16 | 13652513 | METHOD AND SYSTEM FOR USE IN MONITORING PROPERTIES OF PATTERNED STRUCTURES | NOVA MEASURING INSTRUMENTS LTD. | Patented Case | 2014-02-04 | 8643842 | US20130096876A1 | YOEL COHEN BOAZ BRILL | Israel Israel | NGUYEN, SANG H |